血浆蚀刻材料用气体等离子体的应用是一个非常独特的过程,可将固体转换为气体以进行去除。等离子体蚀刻可以消除耗时的化学蚀刻需求,这是耗时的,并使用挥发性有机化合物(VOC)和其他危险化学物质。有机材料,无机材料和聚合物很容易用非腐蚀性氧血浆蚀刻。更复杂的无机材料和金属用类似气体混合物的CF4血浆或血浆蚀刻。
Plasma etching is the process of converting a solid directly to a gas in a low pressure plasma system. This gas is then pumped out of the vacuum chamber at a controlled rate to optimize uniformity and other process parameters. The entire process of etching is performed without the material ever coming in contact with fluid.
The process of etching a polymer, organic substance or hydrocarbon based solid works well with an oxygen based plasma process. This oxygen based plasma etchs these materials by combining the carbon and hydrogen in the molecular structure with oxygen from the plasma. This produces CO and HO in combination with short molecular chains that remain in a gas state and are easily pumped out of the chamber as a gas.
The process of plasma etching to reduce an oxide on the surface of a metal or in a bulk oxide state is etched with a hydrogen based gas or gas mixture. Similarly, this plasma etching process uses the hydrogen to combine with the oxygen on the surface and produce HO and other variants of the bulk molecular structure into a gas that is pumped out of the vacuum system.
使用氩气表面蚀刻表面的过程是一种物理蚀刻方法,与上述化学蚀刻方法相比。在这种血浆蚀刻血浆中重氩原子能量的方法中,血浆的能量非常高。这种高水平的能量使单个氩原子能够向破坏表面材料的分子键的部分提供更多的能量。结果是,将这些表面材料原子或短分子成分蚀刻或弹射到血浆中以去除。
The process of plasma etching a material with a robust molecular structure or complex composition like metals and chemically stable polymers is done with a corrosive gas based component. This corrosive gas of choice often focuses on a fluorine based chemistry like CF4, SF6, or other similar gases. The addition of these kinds of corrosive components provide a method of converting additional chemistries into a gas state providing a method of plasma etching.
Reactive ion etching (RIE)is a plasma etching process that adds a charge to the part being etched which induces a directional component to the etching process. This directionality of the etch enables significantly smaller etch feature sizes which is commonly used in the semiconductor industry.
Control Cabinet:
W 310 mm H 330 mm D 420 mm
Chamber:
Ø 3.9 in, L 10.9 in
Chamber Volume:
2
Gas Supply:
1 gas channel via needle valve
发电机:
1个。有40 kHz
(optional: 13.56 MHz or 2.45 GHz)
Control:
Semi-Automatic
Control Cabinet:
W 560 mm H 600 mm D 600 mm
Chamber:
Ø10.5,16.5 L
Chamber Volume:
24
Gas Supply:
Mass flow controllers
发电机:
1个。有40 kHz
(optional: 13.56 MHz or 2.45 GHz)
Control:
Touch Screen
Control Cabinet:
W 600 mm H 1700 mm D 800 mm
Chamber Volume:
15
Gas Supply:
Mass flow controllers
发电机:
1个。有40 kHz
(optional: 13.56 MHz or 2.45 GHz)
Control:
个人电脑
Control Cabinet:
W 600 mm H 2100 mm D 800 mm
Chamber Volume:
500
Gas Supply:
Mass flow controllers
发电机:
1个。有40 kHz
(optional: 13.56 MHz or 2.45 GHz)
Control:
个人电脑
Control Cabinet:
W 600 mm H 2100 mm D 800 mm
Chamber Volume:
8000
Gas Supply:
Mass flow controllers
发电机:
1个。有40 kHz
(optional: 13.56 MHz or 2.45 GHz)
Control:
个人电脑
Control Cabinet:
W 425 mm H 185 mm D 450 mm
Chamber:
Ø 4.1 in, L 11.8 in
Chamber Volume:
2.6
Gas Supply:
Mass flow controllers
发电机:
1个。有40 kHz
(optional: 13.56 MHz)
Control:
外部PC